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EMC Immunity Testing Solutions
Langer provides cutting-edge EMC testing tools and solutions, enabling engineers to evaluate and optimize the electromagnetic compatibility of their devices. From immunity testing to emission measurements, Langer’s portfolio ensures precision and reliability for developers across industries.
The very small mini burst-field generators produce fields at their tips, which are activated during Burst and ESD testing on the device under examination. These mini burst-field generators are maneuvered manually across the device under test (such as a printed circuit board), keeping their field-emitting tips close to the surface. The vulnerable points react to the pulsed field, leading to potential malfunctions.
Features both active and passive magnetic field probes, enabling developers to measure rapid transient pulsed magnetic fields on electronic devices and printed circuit boards without interference. This allows for the analysis of burst or ESD processes that may lead to issues in the device being tested.
The field sources and the burst transformer are used to harden the device under test. They are powered by an EFT/burst generator.
Near-field probes are essential tools for measuring high-frequency electric and magnetic RF fields on printed circuit boards and devices. With probe heads available in various shapes and sizes, developers can effectively pinpoint emission sources on the printed circuit board and along the RF coupling path to the antenna. Langer EMV-Technik GmbH provides an extensive selection of near-field probes designed for advanced RF-field measurements.
Passive near-field probes are connected to the 50 ohm input of the spectrum analyser or oscilloscope via the measuring cable. There are various probe families for different frequency ranges:
Active near-field probes are connected to the 50 ohm input of the spectrum analyser or oscilloscope via a bias tee. The bias tee powers the preamplifier in the probe head.
Various frequency ranges and gains are available to amplify measurement signals such as weak signals from high-resolution, near-field probes or antennas:
With the IC (integrated circuit) test system, developers evaluate circuit behavior under specific disturbances, both conducted and radiated, as well as their emissions. The IC is tested while in operation. For IC security products, integrated circuits can be thoroughly analyzed through electromagnetic side-channel analysis (SCA), and their functionality can be intentionally disrupted using electromagnetic disturbance pulses (EMFI).
“Tekiknow Technologies specializes in EMI/EMC and RF shielding solutions with a focus on innovation, quality, and sustainability. We deliver reliable, customized solutions tailored to your needs.”
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