LANGER : Near-Field Probes
Near-field probes are utilized for conducting measurements of high-frequency electric and magnetic RF fields on assemblies and devices. The near-field probes from Langer EMV-Technik GmbH are of a consistently high quality. Two characteristics are crucial for a reliable assessment of a near-field probe’s quality:
- Constant sensitivity over a wide range of frequencies
- Great ability to suppress electric fields (magnetic-field probes)
Near-field probes Types
LF, Passive, 100 kHz up to 50 MHz
The LF family comprises seven magnetic-field probes, with four of them being part of our LF1 probe set.
RF, Passive, 30 MHz up to 3 GHz
The RF family includes nine magnetic field probes and six E-field probes, which are offered in sets tailored for various measurement purposes.
XF, Passive, 30 MHz up to 6 GHz
The XF family consists of four magnetic-field probes and three E-field probes as well as customized sets are available.
SX, Passive, 1GHz up to 20 GHz
The SX family comprises three H-field probes and one E-field probe. The SX1 set (two H-field probes and one E-field probe) and the SX-R 20-1 set are available.
HR, Passive, up to 40 GHz
The HR family includes an H-field probe and an E-field probe designed for measuring high-frequency RF fields up to 40 GHz in developmental stages.
MFA, Active, 1MHz up to 6 GHz
The MFA 01 set contains three magnetic field probes, while the MFA 02 set is equipped with two probes specifically designed for low-frequency measurements.
CM-SHP Customized Shapes
Langer EMV-Technik GmbH also produces custom-designed special shapes of near-field probes to meet specific customer needs.We are happy to customize sets based on your specific requirements.