Near-Field Scanner

Nexio is a Market leader in the treatment of electromagnetic waves, near-field scanner helps to design electronic circuits by evaluating their behavior and detecting emission problems. EMI can negatively affect system performance when the operating region of a device deviates from the defined standards or conditions. Based on innovative measurement, analysis, and post-processing methods, Nexio has designed its near-field scanners to assist in the design of electronic circuits by measuring their EMC characteristics.

Identifying the root cause of a problem is 80% of the solution. By using a near-field scanner, you can diagnose the majority of your issues. Embracing the technology of near-field scanning can be a game-changer in troubleshooting and resolving complex technical issues efficiently.

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Automation with BAT-SCAN software

The BAT-SCAN software, created by NEXIO, is tailored for measurements conducted using a near-field scanner, allowing

  • Control measurement equipment via communication (Ethernet, GPIB, USB, RS232, etc.)
  • Real-time analysis of measurement results
  • Graphical and 3D visualization of results  via NFS viewer
  • Automate vector measurements, enabling a direct link with EMC simulation tools on the market.

7 reasons to use Near-Field Scanner

  • Reduces Qualification test days and investigation time.
  • Analyses product performance and modifications.
  • Ensures product quality
  • Accessible to all, no EMC knowledge required.
  • Locates areas of disturbance thanks to 3D visualization.
  • Carries out measurements quickly, compared with conventional EMC measurement equipment.
  • Apply constraints to board specifications & radiated emissions.
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Industrial Solutions

  • Assess non-regressions when making design changes or dealing with component obsolescence.
  • Characterize shielding leaks (location, quantification, etc.) and evaluate the impedance mismatch of PCB tracks, etc.
  • Decline constraints at the level of card and sub-assemblies specifications, but also check resistance to radiated constraints.
  • Optimize component-card or card-housing placement to reduce autoimmunity phenomena.
  • Build databases of components or cards to analyze the competition, 2nd source, new technologies, etc.
  • Calculate the field distribution at any distance using near-field/far-field transformation techniques.